Pattern Window

Styles can be developed in either a 'garment' or a 'pattern' mode. The garment mode gives access to reports used commonly in overseas styling - tracking sample measurements and comments.
The pattern mode has functions to enter pattern piece information and generate pattern sample comparison reports. Shrinkage percentages can be placed with the patterns to quickly evaluate how a pattern has been adjusted. A point of measurement list is also located in the garment/pattern window. This list is connected to the grading tables, allow quick creation of the garment specification report. Four different type of images can be attached to a body to visually describe it.